Precise measurement of the thermal conductivity and temperature capability of thin layers

Description

The characterization of micrometer materials is a critical issue today due to ongoing R&D for new technologies, such as battery and hydrogen applications, as well as miniaturization efforts. Due to the large surface to volume ratio, these types of materials need to be studied separately from bulk materials, but sample preparation and measurements can be very challenging. In addition to our well-established laser flash technique, the PLH L53 setup allows us to extend the measurement range of our non-destructive optical instruments in terms of thickness and thermal transport properties.

The PLH L53 has been developed and optimized to characterize samples with high accuracy over a measurement range of sample thickness from 10 μm to 500 μm and a thermal diffusivity range of 0.01 – 2000 mm²/s. The system can handle a wide range of materials. It is possible to measure samples with semiconducting behavior as well as metals, ceramics or polymers. Typical applications include freestanding films and membranes for the battery and hydrogen industries.