Seebeck coefficient / Electrical conductivity / Harman method / ZT on modules

Desicription

The Linseis LSR platform can be used to characterize thermoelectric materials almost completely, both in the form of solid materials and thin films. In the basic LSR-3 (LSR L31) version, both the Seebeck coefficient and the electrical conductivity (electrical resistance) of solid materials can be measured fully automatically and simultaneously up to a maximum temperature of 1500°C. The basic version can be combined with various options to extend the range of applications.
For example, the low temperature option allows fully automatic measurement using LN2 cooling down to -100°C and the use of a special thin film adapter for measuring films and thin layers.

An optional camera allows the determination of electrical conductivity with the highest accuracy and the use of the high-resistance option significantly extends the measuring range in order to characterize samples with poor electrical conductivity. As the thermal conductivity is required in addition to the Seebeck coefficient and the electrical conductivity in order to calculate the dimensionless figure of merit ZT, it is usually necessary to use another measuring device, such as a LaserFlash, to determine it.

To solve this problem, either an additional LaserFlash can be integrated into the Linseis LSR platform (see LZT meter) or a special adapter can be used, which allows the measurement of solid materials using the Harman method. This is a direct ZT determination which, in combination with the two original measurements, allows conclusions to be drawn about the thermal conductivity. An LSR platform with integrated Harman method is referred to as LSR-4 due to its significant added value. By means of an optional extension of the measuring electronics, the ZT value for modules (TEG) can also be determined in the LSR-4 platform using the same measuring principle in the form of impedance spectroscopy.